Lists

Thursday, June 20, 2013

Agilent Device Analyzer Targets RTN Measurements

While not a fresh news, Agilent newly enhanced B1500A Semiconductor Device Analyzer features WGFMU measurement module with RTN noise measuring capability. It appears that RTN characterization market becomes large enough to warrant a dedicated setup development:

No comments:

Post a Comment

All comments are moderated to avoid spam and personal attacks.