Friday, October 03, 2014
Caeleste Rad-Hard Design Tutorial
Caeleste publishes Bart Dierickx' tutorial "Radiation hard design in CMOS image sensors," presented at CPIX Workshop held in Bonn, Germany on Sept 15-19, 2014. It's a very nice overview of radiations effects combined with some countermeasures. Few slides out of 53 ones:
I am wondering what is new in this slide?
ReplyDeleteI suggest that the tradeoff between hardening technics and the Electro-optic performances could be a more significant study.
Nothing new, just business buzz.
ReplyDeletePeople expect "new" breakthrough Nobel prize material even in a tutorial?
ReplyDeleteThere isn't needed to add redundancy in the photodiodes, because this is equivalent to have a sensor with higher resolution and a way to remove defective pixels during the post processing. An array of photodiodes is a very redundant structure itself. Doesn't need more redundancy. In fact the addition of redundancy as suggested the new, probably will degrade other features, for example the sensitivity or the MTF.
ReplyDeleteRedundancy in the readout circuitry is more reasonable.
If quality is 'good' enough with only 1/2 a pixel, why not just use the other half to expand the dynamic range (i.e. different gain).
ReplyDeleteI agree - not too novel.
I don't understand how something as old as redundancy can be patented one and another time for the same purpose
ReplyDeleteDitto! Why do you need pixel redundancy? It is not SRAM, which calls for each and every bit to be reliable. Pixel array is a highly redundant arrangement in itself.
ReplyDeleteExactly
DeletePlease put the things into their context. Star 250K has been designed so many years ago and successfully used in many radiation harden cameras. These techniques have been proposed at that time.
ReplyDelete-yang ni
But caeleste does not own the IP used in the STAR250
ReplyDelete