Image Sensors in EI 2017 Program

2017 Electronic Imaging Conference to be held on Jan 29-Feb. 2, 2017 in Burlingame, CA, USA (new location near SFO airport), announces its agenda with quite a lot of image sensor content. Few papers, out of many are below:

Keynotes:

• Bayer pattern and image quality, Joerg Künze, Basler AG (Germany)
• Silicon retina technology (Invited), Tobi Delbruck, Institute for Neuroinformatics (INI) (Switzerland)
• CMOS image sensor pixel design and optimization, Boyd Fowler, OmniVision Technologies USA
• Automotive imaging, Patrick Denny, VALEO (Ireland)
• In the quest of vision-sensors-on-chip: Pre-processing sensors for data reduction, Angel Rodríguez-Vázquez, Universidad de Sevilla (Spain)

Regular papers:

• A full-resolution 8K single-chip portable camera system, Tomohiro Nakamura, Takahiro Yamasaki, Ryohei Funatsu, and Hiroshi Shimamoto, NHK Science and Technology Research Laboratories (Japan)
• Filter selection for multispectral imaging optimizing spectral, colorimetric and image quality, Yixuan Wang, Rochester Institute of Technology USA
• Hot pixel rate behavior as pixel sizes go to 1 micron, Glenn Chapman, Rahul Thomas, Israel Koren, and Zahava Koren; Simon Fraser University (Canada) and University of Massachusetts Amherst USA
• Octagonal CMOS image sensor for endoscopic applications, Elena Reis, Alice Andrade, Martin Wäny, Pedro Santos, Ricardo M. Sousa, and Natércia Sousa, Awaiba,Lda (Portugal)
• Optimization of CMOS image sensor utilizing variable temporal multi-sampling partial transfer technique to achieve full-frame high dynamic range with superior low light and stop motion capability, Salman Kabir, Craig Smith, Gerrit Barnard, Alex Schneider, Frank Armstrong, Michael Guidash, Thomas Vogelsang, and Jay Endsley, Rambus Inc. USA
• A lateral electric field charge modulator with bipolar-gates for time-resolved imaging, Yuki Morikawa, Keita Yasutomi, Shoma Imanishi, Taishi Takasawa, Keiichiro Kagawa, Nobukazu Teranishi, and Shoji Kawahito, Shizuoka Univ. (Japan)
• RTS and photon shot noise reduction based on maximum likelihood estimate with multi-aperture optics and semi-photon-counting-level CMOS image sensors, Haruki Ishida, Keiichiro Kagawa, Shoji Kawahito, Taishi Takasawa, Keita Yasutomi, Bo Zhang, Min Seo, and Takashi Komuro; Shizuoka Univ. and Saitama Univ. (Japan)
• Linearity analysis of a CMOS image sensor, Fei Wang and Albert Theuwissen; Technische Univ. Delft (Netherlands) and Harvest Imaging (Belgium)

Thanks to AD for letting me know!