Videos du jour: Hitachi FIB-SEM and OnSemi iToF sensor

FIB-SEM tomography o a CMOS image sensor: 533 serial cross-sectional BSE images of a CMOS image sensor were automatically acquired on a FIB-SEM in 14 hours. Reconstructed 3D data visualizes the arrangement of electrodes and wiring. Slice images gave layer descriptions of the color filter, the plugs with a diameter of about 200 nm, and the metal wiring with the minimum width of approximately 150 nm respectively.

FIB-SEM https://www.hitachi-hightech.com/global/en/products/microscopes/fib-sem/nx2000.html

onsemi’s indirect Time-of-Flight (iTOF) demo at Embedded World shows a 1.2MP sensor that can capture depth maps up to six meters.