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Friday, April 14, 2023

SWIR linear array sensor from NIT

Press release from NIT:

 

The NSC1801 line scan sensor was designed initially for imaging linearly moving objects with high frame rate, high sensitivity and low noise. Its pixel size has the world smallest size of 7.5µm that contributes the lower the manufacturing costs without increasing the cost of lenses.

Now NIT is pleased to release an updated version of NSC1801, where all key parameters have been reworked and overall performances improved. NSC1801 is currently installed in NIT Lisa SWIR cameras.

NSC1801 fully benefits from NIT new manufacturing factory installed in our brand new clean room, that includes our high yield hybridization process. Our new facility allows to cover the full design and manufacturing cycle of these sensors in volume with a level of quality never achieved before. 

Moreover NSC1801 was designed with the objective of addressing new markets that could not invest into expensive and difficult to use SWIR cameras. The result is that our Lisa SWIR camera based on NSC1801 exhibits the lowest price point on the market even in unit quantity.  

Typical applications for NSC1801 are waste sorting, semiconductor and photovoltaic cell inspection, food and vegetable inspection and pharmaceutical inspection. 


Features

Benefits

Pixel size 7.5x7.5µm

Lowest pixel size in the industry to capture sharp details

Resolution 2048 pixels

Large field of view compatible with most lenses from the market

Three gain modes available

Allows selecting the best dynamic range for the scene. 

QE >85%

Boost sensitivity to the maximum available

Line rate up to 60KHz

For imaging fast moving objects 

Exposure time 10µs to 220ms

Fully configurable for capturing the best signal to noise ratio


12 comments:

  1. from the package, it looks like made in China?

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  2. Not at all, it is made in France in our clean room. Pierre POTET CEO

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  3. Nice Sensor, Been using for Solar cell inspection. High Res High speed.

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    Replies
    1. just for curiosity... what type of inspection is done at solar cells with such kind of sensors? i mean what kind of defects can be seen at swir? e.g. cracks in silicon that get visibly due to scattering of the swir light?

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  4. Hello, mainly photo emission when the solar panel is reversed biased it emits SWIR light and defective area can be easily detected . Pierre POTET

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    Replies
    1. thanks, very interesting, i never heard of this effect. heard of applications using the absorption of water to show for example damaged fruit, effects for plastic sorting or using the effect that silicon becomes transparent in semiconductors, but never heard of solar cells being reverse biased acting like "swir leds" for their inspection

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  5. the performance is poor

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  6. poor compare to what ?

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    Replies
    1. to all we have tested

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    2. Have you tested our Line sensor ? I don't believe so since ewe have a new released version that is just sampling for now. Can you elaborate which specific performance or figure is poor ? Thank you. Pierre POTET

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  7. Replies
    1. It is a line array so there is only one line of 2048 pixels

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