Avoiding information loss in the photon transfer method

In a recent paper titled "PCH-EM: A Solution to Information Loss in the Photon Transfer Method" in IEEE Trans. on Electron Devices, Aaron Hendrickson et al. propose a new statistical technique to estimate CIS parameters such as conversion gain and read noise.

Abstract: Working from a Poisson-Gaussian noise model, a multisample extension of the photon counting histogram expectation-maximization (PCH-EM) algorithm is derived as a general-purpose alternative to the photon transfer (PT) method. This algorithm is derived from the same model, requires the same experimental data, and estimates the same sensor performance parameters as the time-tested PT method, all while obtaining lower uncertainty estimates. It is shown that as read noise becomes large, multiple data samples are necessary to capture enough information about the parameters of a device under test, justifying the need for a multisample extension. An estimation procedure is devised consisting of initial PT characterization followed by repeated iteration of PCH-EM to demonstrate the improvement in estimating uncertainty achievable with PCH-EM, particularly in the regime of deep subelectron read noise (DSERN). A statistical argument based on the information theoretic concept of sufficiency is formulated to explain how PT data reduction procedures discard information contained in raw sensor data, thus explaining why the proposed algorithm is able to obtain lower uncertainty estimates of key sensor performance parameters, such as read noise and conversion gain. Experimental data captured from a CMOS quanta image sensor with DSERN are then used to demonstrate the algorithm’s usage and validate the underlying theory and statistical model. In support of the reproducible research effort, the code associated with this work can be obtained on the MathWorks file exchange (FEX) (Hendrickson et al., 2024).

 

RRMSE versus read noise for parameter estimates computed using constant flux implementation of PT and PCH-EM. RRMSE curves for PT μ~ and σ~ grow large near σread=0 and were clipped from the plot window.

Open access paper link: https://ieeexplore.ieee.org/document/10570238