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Thursday, February 24, 2011

ISSCC Review, Part 3

Albert Teuwissen continues to publish ISSCC 2011 reviews. The third part covers:

M.W. Seo ( Shizuoka University) "An 80mVrms Temporal Noise 82 dB Dynamic Range CMOS Image Sensor with a 13-to-19b Variable Resolution Column-Parallel Folding-Integration/Cyclic ADC"

C. Lotto (Heliotis) "A Sub-Electron Readout Noise CMOS Image Sensor with Pixel-Level Open-Loop Voltage Amplification"
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3 comments:

  1. adiFebruary 24, 2011 at 7:11 PM

    Isn't it more efficient to use a sigma delta with inherent multiple sampling instead of folding or whatever other ADC architecture? And how can they obtain 19bit of resolution with a single ended(!) column level adc? Do they use special calibration techniques? Very curious to read the paper...

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  2. Vladimir KoifmanFebruary 24, 2011 at 8:14 PM

    One other thing is a seeming disconnect in numbers: 19 bit is more than 114dB of DR, while the sensor is said to have the DR of 82dB. Then, why does one need the extra 30+ dB from the ADC in this sensor?

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  3. AnonymousFebruary 24, 2011 at 9:08 PM

    I don't the proceeding of ISSCC, any one can provide a schematic of "A Sub-Electron Readout Noise CMOS Image Sensor with Pixel-Level Open-Loop Voltage Amplification" ??

    thanks a lot in advance

    ReplyDelete

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