Jacob Engelberg & Uriel Levy of The Hebrew University, Jerusalem have published a Nature Photonics Comment piece titled "Standardizing flat lens characterization".
The field of flat lens research brings innovative nanophotonic design concepts to the world of macro-optics. However, when evaluating the performance of these lenses a lack of consistency prevents proper comparison of competing technologies. This problem can be solved by using methods developed in industry for conventional lenses.
We will focus on the two most basic performance metrics: resolution and
signal-to-noise ratio (SNR). The main problems we encountered in the
field are the use of full-width at half-maximum (FWHM) as a resolution
metric by some authors, despite it being an insufficient metric, and the
use of ‘focusing efficiency’ as the sole SNR metric. In a nutshell, our
suggestion is to use the modulation transfer function (MTF) as the
resolution metric and diffraction efficiency and overall transmission as
the SNR metric. These parameters can be characterized both on-axis and
off-axis if the flat lens is designed to cover a certain field-of-view
(FOV).
Link to full article: https://www.nature.com/articles/s41566-022-00963-7
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