Thursday, June 26, 2014
Modern Image Sensor Testing Challenges
Formfactor and Advantest presentation "Can testers and probe cards keep up with speed requirements for image sensors?" at Semiconductor Test Workshop in San Diego, CA on June 8-11, 2014 talks about the high speed interface testing issues:
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Whoever has written this summary (Advantest/Formfactor) is not quite informed about instantaneous BW requirements and Frame Rates of smaller size arrays in case of high end cameras. Cannot speak for all of the 3 cameras mentioned above but some of them have the instantaneous BW rates geared for fastest speed. The link needs to serve that speed. And yes, people are testing these at speed on ATE machines with probe cards.
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