Applied Optics accepted for publication a paper on crosstalk:
Crosstalk quantification, analysis and trends in CMOS image sensors
Lior Blockstein, and Orly Yadid-Pecht, Fellow IEEE
The VLSI Systems Center/ Ben Gurion University, P.O.B. 653 Beer-Sheva, Israel.
Dept of Electrical and Computer Engineering, University of Calgary, Alberta, Canada.
Pixel crosstalk (CTK) consists of three components, optical CTK (OCTK), electrical CTK (ECTK) and spectral CTK (SCTK). The CTK has been classified into two groups, pixel architecture dependant and pixel architecture independent. The pixel architecture dependant CTK (PADC) consists of the sum of two CTK components, i.e. the OCTK and the ECTK. This work presents a short summary of a large variety of methods for PADC reduction. Following, this work suggests a clear quantifiable definition of PADC. Three CMOS Image Sensors based on different technologies were empirically measured, using a unique scanning technology, the S-cube. The PADC is analyzed, and technology trends are shown.
The crosstalk is measured for 3.2, 2.2 and 1.75um pixels. There is also a great pixel crosstalk bibliography at the end of the article.