Albert Teuwissen continues to publish ISSCC 2011 reviews. The third part covers:
M.W. Seo ( Shizuoka University) "An 80mVrms Temporal Noise 82 dB Dynamic Range CMOS Image Sensor with a 13-to-19b Variable Resolution Column-Parallel Folding-Integration/Cyclic ADC"
C. Lotto (Heliotis) "A Sub-Electron Readout Noise CMOS Image Sensor with Pixel-Level Open-Loop Voltage Amplification"