Wednesday, December 07, 2016

Pyxalis Paper on Transfer Gate Spillback

Pyxalis publishes its presentation "Effects of Transfer Gate Spill Back in Low Light High Performances CMOS Image Sensors" by Julien Michelot, Alexis de Ipanema Moreira, Paul Monsinjon, and Sophie Caranhac presented at Photon Counting, Low Flux and High Dynamic Range Optoelectronic Detectors Workshop in Toulouse, France, in November 2016. Few slides from the presentation:

Posted by Vladimir Koifman at 19:35

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