Friday, October 03, 2014

Caeleste Rad-Hard Design Tutorial

Caeleste publishes Bart Dierickx' tutorial "Radiation hard design in CMOS image sensors," presented at CPIX Workshop held in Bonn, Germany on Sept 15-19, 2014. It's a very nice overview of radiations effects combined with some countermeasures. Few slides out of 53 ones:

10 comments:

  1. I am wondering what is new in this slide?

    I suggest that the tradeoff between hardening technics and the Electro-optic performances could be a more significant study.

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  2. Nothing new, just business buzz.

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  3. People expect "new" breakthrough Nobel prize material even in a tutorial?

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  4. There isn't needed to add redundancy in the photodiodes, because this is equivalent to have a sensor with higher resolution and a way to remove defective pixels during the post processing. An array of photodiodes is a very redundant structure itself. Doesn't need more redundancy. In fact the addition of redundancy as suggested the new, probably will degrade other features, for example the sensitivity or the MTF.
    Redundancy in the readout circuitry is more reasonable.

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  5. If quality is 'good' enough with only 1/2 a pixel, why not just use the other half to expand the dynamic range (i.e. different gain).

    I agree - not too novel.

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  6. I don't understand how something as old as redundancy can be patented one and another time for the same purpose

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  7. Ditto! Why do you need pixel redundancy? It is not SRAM, which calls for each and every bit to be reliable. Pixel array is a highly redundant arrangement in itself.

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  8. Please put the things into their context. Star 250K has been designed so many years ago and successfully used in many radiation harden cameras. These techniques have been proposed at that time.
    -yang ni

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  9. But caeleste does not own the IP used in the STAR250

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