Fraunhofer Workshop on CMOS Imaging

The program of 6th Fraunhofer IMS Workshop on CMOS Imaging has been published. The workshop is to be held in Duisburg, Germany on June 12-13, 2012. The program includes:

2D - Imaging

• Worse Imagers – Better Images,
  Albert Theuwissen, Harvest Imaging
• Optimizing the Heart of Modern CIS Pixels: the Pinned Diode and Beyond,
  Amos Fenigstein, TowerJazz
• Cmos Imagers for Professional Applications,
  Rainer Schweer, Viimagic
  Peter Centen, Grass Valley
• Space Imaging,
  Dirk Viehmann, Astrium

3D - Time-of-Flight Imaging

• 3D-TOF Imaging with PMD Sensors - application requirements and solutions,
  Robert Lange, PMD Technologies
• CAPDs and 3D-TOF Imaging,
  Daniel van Nieuwenhove, SoftKinetic
• CMOS Sensors for TOF Ranging,
  Werner Brockherde, Fraunhofer IMS

Non-visible Imaging

• Thermal Imagers Based on Uncooled Microbolometers,
  Holger Vogt, Fraunhofer IMS
• Medical X-ray imaging Using Wafer-scale CMOS Image Sensors,
  Jan Bosiers, Teledyne DALSA

Optics and Camera Testing

• Optics for CMOS Imagers,
  Ziv Attar, OpEra Optics
• Camera Characterisation Based on EMVA 1288,
  Bernd Jähne, University of Heidelberg

SPAD Imaging

• Scaleable SPAD Structures for High Resolution Single Photon Image Sensors,
  Robert Henderson, University of Edinburgh
• Fully Integrated Arrays of Digital Si-Photomultipliers,
  York Hämisch, Philips
• SPAD Technology and Applications,
  Franco Zappa, Politecnico di Milano