2016 Electronic Imaging Symposium is organized by IS&T without SPIE. The Symposium is to be held in San Francisco, CA, on February 14-18, 2016. Its preliminary agenda has been published and has a broad collection of image sensor presentations. Below is a list of them in Image Sensors and Imaging Systems path:
A high dynamic range linear vision sensor with event asynchronous and frame-based synchronous operation
Juan A. Leñero-Bardallo, Ricardo Carmona-Galán, and Angel Rodríguez-Vázquez, Universidad de Sevilla (Spain)
A dual-core highly programmable 120dB image sensor
Benoit Dupont, Pyxalis (France)
High dynamic range challenges
Short presentation by Arnaud Darmont
Image sensor with organic photoconductive films by stacking the red/green and blue components
Tomomi Takagi, Toshikatu Sakai, Kazunori Miyakawa, and Mamoru Furuta; NHK Science & Technology Research Laboratories and Kochi University of Technology (Japan)
High-sensitivity CMOS image sensor overlaid with Ga2O3/CIGS heterojunction photodiode
Kazunori Miyakawa, Shigeyuki Imura, Misao Kubota, Kenji Kikuchi, Tokio Nakada, Toru Okino, Yutaka Hirose, Yoshihisa Kato, and Nobukazu Teranishi; NHK Science and Technology Research Laboratories, NHK Sapporo Station, Tokyo University of Science, Panasonic Corporation, University of Hyogo, and 6Shizuoka University (Japan)
Sub-micron pixel CMOS image sensor with new color filter patterns
Biay-Cheng Hseih, Sergio Goma, Hasib Siddiqui, Kalin Atanassov, Jiafu Luo, RJ Lin, Hy Cheng, Kuoyu Chou, JJ Sze, and Calvin Chao; Qualcomm Technologies Inc. (United States) and TSMC (Taiwan)
A CMOS image sensor with variable frame rate for low-power operation
Byoung-Soo Choi, Sung-Hyun Jo, Myunghan Bae, Sang-Hwan Kim, and Jang-Kyoo Shin, Kyungpook National University (South Korea)
ADC techniques for optimized conversion time in CMOS image sensors
Cedric Pastorelli and Pascal Mellot; ANRT and STMicroelectronics (France)
Miniature lensless computational infrared imager
Evan Erickson, Mark Kellam, Patrick Gill, James Tringali, and David Stork, Rambus (United States)
Focal-plane scale space generation with a 6T pixel architecture
Fernanda Oliveira, José Gabriel Gomes, Ricardo Carmona-Galán, Jorge Fernández-Berni, and Angel Rodríguez-Vázquez; Universidade Federal do Rio de Janeiro (Brazil) and Instituto de Microelectrónica de Sevilla (Spain)
Development of an 8K full-resolution single-chip image acquisition system
Tomohiro Nakamura, Ryohei Funatsu, Takahiro Yamasaki, Kazuya Kitamura, and Hiroshi Shimamoto, Japan Broadcasting Corporation (NHK) (Japan)
Characterization of VNIR hyperspectral sensors with monolithically integrated optical filters
Prashant Agrawal, Klaas Tack, Bert Geelen, Bart Masschelein, Pablo Mateo Aranda Moran, Andy Lambrechts, and Murali Jayapala; Imec and TMC (Belgium)
A 1.12-um pixel CMOS image sensor survey
Clemenz Portmann, Lele Wang, Guofeng Liu, Ousmane Diop, and Boyd Fowler, Google Inc (United States)
A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique
Xiaoliang Ge, Bastien Mamdy, and Albert Theuwissen; Technische Univ. Delft (Netherlands), STMicroelectronics, Universite Claude Bernard Lyon 1 (France), and Harvest Imaging (Belgium)
Increases in hot pixel development rates for small digital pixel sizes
Glenn Chapman, Rahul Thomas, Rohan Thomas, Klinsmann Meneses, Tony Yang, Israel Koren, and Zahava Koren; Simon Fraser Univ. (Canada) and Univ. of Massachusetts Amherst (United States)
EMVA1288 3.1rc2 and research on version 3.2 and next
Arnaud Darmont and Adrien Lombet, APHESA SPRL (Belgium)
A time-of-flight CMOS range image sensor using 4-tap output pixels with lateral-electric-field control
Taichi Kasugai, Sang-Man Han, Hanh Trang, Taishi Takasawa, Satoshi Aoyama, Keita Yasutomi, Keiichiro Kagawa, and Shoji Kawahito; Shizuoka Univ. and Brookman Technology (Japan)
Design, implementation and evaluation of a TOF range image sensor using multi-tap lock-in pixels with cascaded charge draining and modulating gates
Trang Nguyen, Taichi Kasugai, Keigo Isobe, Sang-Man Han, Taishi Takasawa, De XIng Lioe, Keita Yasutomi, Keiichiro Kagawa, and Shoji Kawahito; Shizuoka Univ. and Brookman Technology (Japan)
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