Friday, June 20, 2014

Open Access Papers

The new open access IEEE publication, IEEE Journal of the Electron Devices Society, which published Eric Fossum's pinned PD review, now publishes too more papers on photodiodes:

"Pixel Level Characterization of Pinned Photodiode and Transfer Gate Physical Parameters in CMOS Image Sensors" by Goiffon, V.; Estribeau, M.; Michelot, J.; Cervantes, P.; Pelamatti, A.; Marcelot, O.; Magnan, P.
Institut Suprieur de l'Aeronautique et de l'Espace (ISAE), Universite de Toulouse, Pyxalis

"Extraction and Estimation of Pinned Photodiode Capacitance in CMOS Image Sensors" by Chao, C.Y.; Chen, Y.; Chou, K.; Sze, J.; Hsueh, F.; Wuu, S.
TSMC

Thanks to DSSB for the link!

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