Tuesday, January 12, 2016

ON Semi Presents 47MP CCD

BusinessWire: ON Semiconductor announces the KAI-47051 CCD, the world’s highest resolution Interline Transfer CCD device. The 47MP KAI-47051 increases the resolution available for applications such as end-of-line flat panel inspection and aerial mapping by more than 50% compared to the 29MP KAI-29050 CCD widely used in these applications today. This is achieved while retaining the CCD-level image uniformity and global shutter architecture those applications require. The new device is aimed to the growing inspection demand for higher resolution smartphones, tablets, computer monitors, and televisions; and to improve image quality and overall efficiency in surveillance applications such as aerial mapping.

In addition to providing higher resolution through a larger optical format, the KAI-47051 incorporates a reduced-noise amplifier that lowers read noise by 15% compared to the existing device, increasing DR to 66dB. A 16-output architecture enables a maximum frame rate of 7fps, almost double that of the existing, lower resolution device.

One of the nice features of ON Semi CCDs is a fairly detailed spec published together with the new product announcement:

5 comments:

  1. announced and allready integrated: SVS Vistek announced a camera with this sensor a few days back:
    https://wtsconnects.wordpress.com/2016/01/04/47-mpixel-industrial-camera-is-available-in-camera-link-or-coaxpress/
    https://www.svs-vistek.com/en/svcam-cameras/svs-svcam-series.php?s=svcam-shr903

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  2. The EMCCD by ON Semi the took the 2015 Product of the year award from Electronic Products:

    http://www.electronicproducts.com/Sensors_and_Transducers/Image_Sensors_and_Optical_Detectors/A_CCD_to_make_you_safer.aspx

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    Replies
    1. I wonder where this device is fabbed? Rochester or someplace else? Anyway, the switchable gain seems like a nice feature.

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    2. Eric, this is a CCD and there are not that many CCD foundries in the world can offer a PPD process with this dark performance. Not to say NONE. So you can be pretty sure that the sensor comes out of the Rochester fab.

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  3. To my opinion it was and it remains strange that the DR is defined as just the ratio of the full well capacity over the noise of the amplifier. So it is always defined for an exposure time equal to 0 sec, and can never be reached in a real situation. To my knowledge there are not that many applications that work with an exposure time of 0 sec.
    But for a CCD it is even more striking : during the normal readout cycle of a CCD (especially an interline transfer CCD) quite a bit of dark shot noise can build up in the vertical registers and neither this noise is taken into account in the definition of the dynamic range. Thus the dynamic range of a CCD is the one that can be obtained when the CCD is not exposed to light and is not readout ... Interesting challenge to measure it !

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