1st Executive Infrared Imaging Forum

Yole Développement and its partner CIOE announce the 1st Executive Infrared Imaging Forum: From Niche to Large Volume Applications. Organized by Yole and hosted by CIOE, this event will take place on September 8, 2016 in Shenzhen, alongside the 18th China International Optoelectronic Expo 2016. The Forum agenda:

• Thermal Imager with Microbolometer for Smartphone: Evolution & Comparison on the last Technologies Trends
  Sylvain Hallereau, Project Manager, System Plus Consulting
• Molded, Wafer Level Optics for High Volume Applications
  John Franks, Technical Director, Umicore Electro Optic Materials
• Fabless Development of CMOS Micro-bolometer FPA for High Performance Consumer Application
  Kwyro Lee, CTO of Sirius Inc. & Prof. in School of EECS, KAIST, Daejon, Korea
• NETD, uncooled FPA, Electro-Optic characterization, TWS, SmartIRTM
  Frédéric Mathieu, Chief Operating Officer & Project Manager, Device-ALab
• Thermodiode Infrared Technology for Mass Market Applications
  Andreas Krauss, Product Management Sensor Components (AE/PRM-S) , Robert Bosch GmbH
• Keynote - TBD
  Stuart Klapper, Autoliv
• Uncooled IR Imaging Market Perspectives
  Eric Mounier, Senior Analyst, Yole Développement
• Tracking Illuminator: Novel Instrument Combining Thermal IR Detection with VIS Illumination
  Hubert Jerominek, INO
• ULIS inside "Smart Buildings"
  Cyrille Trouilleau, Product Manager, ULIS
• Wuhan GST's very Low Cost Uncooled Infared Detector Development
  Gao Jianfei, Detector Center Director, GUIDE
• Thermal and Hyperspectral Imaging solutions for Integrators
  Eric Guyot, Director French Office and IR Cameras Product Line Manager, Telops