EOS Conference on Frontiers in Electronic Imaging

European Optical Society (EOS) announced an advance program on Frontiers in Electronic Imaging to be held in Munich, Germany on June 15 - 16, 2009. Most of the conference is devoted to custom designed image sensors for space, industrial, medical and other applications. The main sessions topics are:

• Application-Specific , High-Performance Image Sensors
• Single-Photon Imaging
• Advanced Optical 3D Imaging

There is also a big number of invited papers:

Application Specific CMOS Image Sensors Dedicated to Space Applications: Reaching the Maturity Era
Pierre Magnan, Institut Supérieur de l'Aéronautique et de l'Espace - ISAE (FR).

Custom Image sensors are extensively used in space applications, either for optical payloads or various satellite servitude sensors. CMOS image sensor technology has now achieved such a maturity level that it is considered as a first choice for a wide range of operational programs as illustrated on examples.

Wide Dynamic Range Image Sensors
Orly Yadid-Pecht, University of Calgary (CA).

The work done to provide image sensors with a wide dynamic range is reviewed. The different classes of solutions, which consist of logarithmic sensors, "clipped" sensors, multimode sensors, frequency-based sensors, time to first spike and sensors with control over integration time are described. Three generations of our AWARD - Automatic wide accepted range detector, are described. The first generation was mainly meant for rolling shutter, the next was mainly meant for low power and the third was mainly meant for snap-shot applications. Results and analysis of the solutions and possible future directions will be presented.

Single Photon Imaging Using a CCD and Electron Multiplication
Mark Robbins, e2v technolgies plc., Chelmsford (UK).

This article presents an overview of low light imaging using charge-coupled devices. Emphasis is placed on electron multiplication technology, which is incorporated within the current sensors of choice for many demanding applications requiring highperformance imaging down to the single photon level.

Scannerless 3D-ToF Sensors
Bedrich Hosticka, Fraunhofer Institute for Microelectronics, Duisburg (DE).

In this talk the state of the art of "scannerless" 3D-Time-of-Flight sensors is presented. The principle, different realization approaches, performance limits, possible technology realizations, sensor examples, and future developments are considered.

Thanks to A.T. for letting me know about the conference.