Wednesday, March 25, 2015

Forza Selects Silicon Frontline's IR Drop and Resistance Mapping Tool

Marketwired: Silicon Frontline Technology announces that Forza Silicon has selected the company's P2P (IR Drop and Resistance Mapping) for fast, early IR Drop analysis and full-chip verification of their CMOS image sensors.
"Forza Silicon is focused on providing customers with cutting-edge image sensor solutions and we have stringent verification requirements in order to deliver high quality imagers," said Kevin Johnson, CAD Manager at Forza Silicon. "We selected Silicon Frontline's P2P to perform full-chip powernet analysis of our CMOS image sensors designs because it meets our accuracy, speed and quality standards."

Resistance Mapping may be performed at any point in the design cycle, allowing early identification and fixes of problem areas. This ensures detailed IR drop and electromigration analysis is performed with a good candidate design, providing faster time to design closure and earlier market entry.

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