EMVA’s annual two-day event, where machine vision industry and academic research meet to learn from each other, get an understanding of the newest research results, of open problems from applications, learn about new and emerging application fields, and to discuss new research cooperation between industry and academics.
The upcoming forum will take place Thursday & Friday, October 12 – 13, 2023, in Wageningen, The Netherlands.
EMVA’s local partner hosting the event is the Wageningen University & Research.
Register here: https://emvf-2023.emva.b2match.io/home
Focal Topic:
Real-world Machine Vision Challenges – Coping with Variability and Uncontrolled Environments
Machine vision solutions provide great value to end-users, but also must function well in real-world environments like agriculture, environmental monitoring, industrial and medical applications. Depending on the application at hand, specific challenges arise which concern the variability of the vision task as well as possible disturbances or operational conditions like for example large varieties of disturbances, variations of the objects to be inspected or unknown camera poses.
The European Machine Vision Forum is an annual event of the European Machine Vision Association - EMVA. The aim is to foster interaction between the machine vision industry and academic research to learn from each other, discuss the newest research results as well as problems from applications, learn about emerging application fields, and to discuss research cooperation between industry and academic institutes. The overall aim is to accelerate innovation by translating new research results faster into practice.
The forum is directed to scientists, development engineers, software and hardware engineers, and programmers both from research and Industry.
What to expect
- Plenary sessions with carefully selected contributed and invited talks, presenting a broad variety of a focused topic of the forum.Extended coffee and lunch breaks and evening get-together for Networking.
- Teaser sessions dedicated to poster presentations as well as hardware and software demonstrations with ample room for discussions in small groups. Each participant can submit papers and posters for free and also show demos (table-top exhibition possibilities).
- Each participant will receive a certificate of his participation detailing the program.
Keynotes
Seeing Objects in Random Dot Videos
Prof. Dr. Alfred M. Bruckstein
Technion IIT, Haifa, Israel
Contribution of Light-field Cameras to Visual Navigation
Prof. Dr. Christophe Cudel
Université de Haute-Alsace - Irimas institute - Mulhouse, France
Stacked Image Sensors - Path Towards New Applications in the CIS World
Prof. Dr. Albert Theuwissen
Harvest imaging, Bree, Belgium
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