Thursday, July 19, 2012

Wafer Scale X-Ray Sensors Article

July-Aug 2012 issue of EETimes-Europe has article an article "Wafer-scale CMOS X-ray imaging for medical applications" by Tanner EDA representative Paul Double and Renato Turchetta from UK Rutherford Labs (see pp. 28-29).

The article mostly expands and illustrates the joint Tanner-Rutherford-TowerJazz announce from a month ago. The sensor is said to be based on TowerJazz high yield specialty 180/350nm dual-gate CIS process.

A three-sided ‘buttable’ sensor design with readout circuitry designed
on one single edge allows for the sensors to be ‘tiled’ together in a 2x2
arrangement.

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