Tuesday, September 19, 2017

Functional Safety in Automotive Image Sensors

ON Semi publishes a webinar on Evaluating Functional Safety in Automotive Image Sensors:

3 comments:

  1. Nothing new, i gave the same presentation more than 10 years ago and i had a set of faulty images for my customers to try.
    I have a patent about the technique used inside the image sensor to provide in-sensor functional safety and fast test modes. The sensor actually used a mix of various techniques in order to reach full production test coverage and in-system testing capability. It was quite typical for a company specialized in automotive sensors but unusual for an image sensor.

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  2. It's a great technique, sounds like you were way ahead of the times! With complexity in a sensor now you would need more than just a set of images. Probably hundreds or maybe thousands of faulty images. Would take an entire team and long effort now.

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  3. The sensor at the times was already very complex (global shutter, multiple regions of exposure, multiple ROI, two HDR modes, multi-ramp column-parallel ADC, register shadowing, defect pixel correction, black level correction and so on). What we did nit have at that time were the high speed LVDS I/Os and a lot of digital functions but it is not the most difficult to test.
    What i found really difficult to test in-situ were the analog functions and especially anything in the middle of the pixel array that could relate to a partly defect matrix.

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