Image Sensors at 2016 EI Symposium

2016 IS&T International Symposium on Electronic Imaging to be held on Feb. 14–18 in San Francisco, CA, publishes its preliminary Program. There are many image sensor related short courses and papers:

EI13: Introduction to CMOS Image Sensor Technology
Instructor: Arnaud Darmont, APHESA

A time-of-flight CMOS range image sensor using 4-tap output pixels with lateral-electric-field control,
Taichi Kasugai, Sang-Man Han, Hanh Trang, Taishi Takasawa, Satoshi Aoyama, Keita Yasutomi, Keiichiro Kagawa, and Shoji Kawahito;
Shizuoka Univ. and Brookman Technology (Japan)

Design, implementation and evaluation of a TOF range image sensor using multi-tap lock-in pixels with cascaded charge draining and modulating gates,
Trang Nguyen, Taichi Kasugai, Keigo Isobe, Sang-Man Han, Taishi Takasawa, De XIng Lioe, Keita Yasutomi, Keiichiro Kagawa, and Shoji Kawahito;
Shizuoka Univ. and Brookman Technology (Japan)

A high dynamic range linear vision sensor with event asynchronous and frame-based synchronous operation,
Juan A. Leñero-Bardallo, Ricardo Carmona-Galán, and Angel Rodríguez-Vázquez,
Universidad de Sevilla (Spain)

A dual-core highly programmable 120dB image sensor,
Benoit Dupont,
Pyxalis (France)

Analog current mode implementation of global and local tone mapping algorithm for wide dynamic range image display,
Peng Chen, Kartikeya Murari, and Orly Yadid-Pecht,
Univ. of Calgary (Canada)

High dynamic range challenges
Short presentation by Arnaud Darmont, APHESA SPRL (Belgium)

Image sensor with organic photoconductive films by stacking the red/green and blue components,
Tomomi Takagi, Toshikatu Sakai, Kazunori Miyakawa, and Mamoru Furuta;
NHK Science & Technology Research Laboratories and Kochi University of Technology (Japan)

High-sensitivity CMOS image sensor overlaid with Ga2O3/CIGS heterojunction photodiode,
Kazunori Miyakawa, Shigeyuki Imura, Hiroshi Ohtake, Misao Kubota, Kenji Kikuchi, Tokio Nakada, Toru Okino, Yutaka Hirose, Yoshihisa Kato, and Nobukazu Teranishi;
NHK Science and Technology Research Laboratories, NHK Sapporo Station, Tokyo University of Science, Panasonic Corporation, University of Hyogo, and Shizuoka University (Japan)

Sub-micron pixel CMOS image sensor with new color filter patterns,
Biay-Cheng Hseih, Sergio Goma, Hasib Siddiqui, Kalin Atanassov, Jiafu Luo, RJ Lin, Hy Cheng, Kuoyu Chou, JJ Sze, and Calvin Chao;
Qualcomm Technologies Inc. (United States) and TSMC (Taiwan)

A CMOS image sensor with variable frame rate for low-power operation,
Byoung-Soo Choi, Sung-Hyun Jo, Myunghan Bae, Sang-Hwan Kim, and Jang-Kyoo Shin, Kyungpook National University (South Korea)

ADC techniques for optimized conversion time in CMOS image sensors,
Cedric Pastorelli and Pascal Mellot; ANRT and STMicroelectronics (France)

Miniature lensless computational infrared imager,
Evan Erickson, Mark Kellam, Patrick Gill, James Tringali, and David Stork,
Rambus (United States)

Focal-plane scale space generation with a 6T pixel architecture,
Fernanda Oliveira, José Gabriel Gomes, Ricardo Carmona-Galán, Jorge Fernández-Berni, and Angel Rodríguez-Vázquez;
Universidade Federal do Rio de Janeiro (Brazil) and Instituto de Microelectrónica de Sevilla (Spain)

Development of an 8K full-resolution single-chip image acquisition system,
Tomohiro Nakamura, Ryohei Funatsu, Takahiro Yamasaki, Kazuya Kitamura, and Hiroshi Shimamoto,
Japan Broadcasting Corporation (NHK) (Japan)

A 1.12-um pixel CMOS image sensor survey,
Clemenz Portmann, Lele Wang, Guofeng Liu, Ousmane Diop, and Boyd Fowler,
Google Inc (United States)

A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique,
Xiaoliang Ge, Bastien Mamdy, and Albert Theuwissen;
Technische Univ. Delft (Netherlands), STMicroelectronics, Universite Claude Bernard Lyon 1 (France), and Harvest Imaging (Belgium)

Increases in hot pixel development rates for small digital pixel sizes,
Glenn Chapman, Rahul Thomas, Rohan Thomas, Klinsmann Meneses, Tony Yang, Israel Koren, and Zahava Koren;
Simon Fraser Univ. (Canada) and Univ. of Massachusetts Amherst (United States)

Correlation of photo-response blooming metrics with image quality in CMOS image sensors,
Pulla Reddy Ailuri, Orit Skorka, Ning Li, Radu Ispasoiu, and Vladi Koborov;
ON Semiconductor (United States)