Wednesday, January 27, 2010

Nobukazu Teranishi Promoted to IEEE Fellow

IEEE Electron Devices Society elevated Nobukazu Teranishi of Panasonic to Fellow Members "for contribution to the development of charge-coupled device image sensors". From

"Mr. Nobukazu Teranishi was born in 1953. He received the B.S. and M.S. degrees in physics from University of Tokyo, 1976 and 1978, respectively.

He has developed image sensors and cameras at NEC Corporation from 1978 to 2000 and at Matsushita Electric Industrial Co., Ltd. from 2000 to present. He is a general manager at Image Sensor Business Unit, Semiconductor Company. He has authored and co-authored 78 papers and has submitted 95 patents. He won the Prize of the President of KEIDANREN of National Invention Awards in 1994, Commendation by Minister of State for Science and Technology in 1997, and Niwa-Takayanagi Award from the Institute of Image Information and Television Engineers in 2000, by his contributions to image sensor technology development including the pinned photodiode invention. His group won the Technology Progress Award in 1986 from the Institute of Television Engineers of Japan, the Technology Award in 1986 from the Motion Picture and Television Society of Japan, the Emmy Award in 1991 by the broadcast-use CCD camera development. His group also won the Fujio Award in 1993 from the Institute of Television Engineers of Japan by the HDTV CCD image sensor technology development. He is a fellow of the Institute of Image Information and Television Engineers, where he served as a chairman of the paper editor committee and a chairman of the Information Sensing Committee. He is also a senior member of IEEE, where he served as a guest editor of IEEE Transactions on Electron Devices for s special issue on solid-state image sensors in 1997 and 2003. He also served as a general chairman for the 1999 and 2005 IEEE Workshop on Charge-Coupled Devices & Advanced Image Sensors. He is a member of the steering committee of the aforementioned workshop and the Walter Kosonocky Award. He was a sub-program committee member of the IEEE International Electron Devices Meeting in 1994, 1995, 2002, and 2003. He is a program committee member of the Electronic Imaging Conference.

Nobukazu Teranishi is going to host IISW in 2011 in Japan.


  1. Better link:

  2. I've just changed the broken link to the "better" one.


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