"trinamiX 3D Imaging is based on patented Beam Profile Analysis technology. Beam profile analysis is an active measuring principle, that means that the object to be measured is illuminated with a light source emitting a regular dot pattern. The reflection of each light spot is captured by a sensor (e.g. a CMOS camera) and its beam profile is then being analyzed. From the specific beam profile, we extract the distance and information about the material of the measured object. This novel approach enables having an extra channel of information for improving decision making, robustness across platforms and reducing computational need over traditional technologies."
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