Wednesday, March 21, 2012

Image Sensors 2012 Conference Report, Day 1

Albert Theuwissen reports from Intertech-Pira Image Sensors 2012 conference being held these days in London, UK.

Nobukazu Teranishi of Panasonic talked about "Dark Current and White Blemishes" in sensors. After talking about different gettering techniques : internal gettering, external gettering and proximity gettering, Nobukazu-san presented a new dark current generation model for the pinned photodiodes. His conclusion was that the best dark current is achieved by using channel-stop diffusions in place of LOCOS and STI isolation.

1 comment:

  1. as in a CCD. Some sensors use this techique already.


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