Sunday, April 23, 2017

Image Sensor Reliability, Variations, and Drifts over Time

Albert Theuwissen has a unique experience with image sensor statistics and their parameters changing over time when his students run through the same devices characterization, course after course, year after year. So, he came up with a brilliant idea to present his knowledge in a report on CMOS sensors reproducibility, variability, and reliability. The first info about the report is expected to be available in a few weeks.
Posted by Vladimir Koifman at 07:39

2 comments:

  1. Albert Theuwissen - Harvest ImagingApril 24, 2017 at 2:32 PM

    Vladimir, thanks for posting and thanks for your kind words.
    But what will be published in the report is slightly different from what you suggested. I bought new cameras that will be used in this project. All measurements are coming from dedicated evaluation of those cameras, measurments done by calibrated equipment. So it is not the results of the courses that are being reported.

    ReplyDelete
    Replies
    1. Vladimir KoifmanApril 24, 2017 at 6:09 PM

      Thank you for the clarifications, Albert. Initially, I thought that you would be using your huge database of the measurements collected over 5+ years of courses. It could be quite interesting to see 5 year old sensors measured now and then.

      Delete

All comments are moderated to avoid spam and personal attacks.

Subscribe to: Post Comments (Atom)